Gerhard Meyer

City:

Wollerau

Country:

Switzerland

Published Applications:

Last publication date:

2016-08-04

Top Assignees for applications by Gerhard Meyer

The entities that hold a legal rights for patent applications filed by inventor Meyer Gerhard:

Gerhard Meyer from Wollerau, CH has applied for patents for these inventions. The list has both pending applications and granted patents:

Determination of local contact potential difference by noncontact atomic force microscopy

Determination of local contact potential difference by noncontact atomic force microscopy

InventorID:

1147994 ⎘