Frans De Nooij

City:

Eindhoven

Country:

Netherlands

Published Applications:

Last publication date:

2015-08-06

Top Assignees for applications by Frans De Nooij

The entities that hold a legal rights for patent applications filed by inventor De Nooij Frans:

Frans De Nooij from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:

Image sequence and evaluation method and system for structured illumination microscopy

Structured illumination microscopy optical arrangement including projection artifact supression element

Method and apparatus for determining a height of a number of spatial positions on a sample

InventorID:

1164952 ⎘