Tokyo
Japan
20
2025-03-20
The entities that hold a legal rights for patent applications filed by inventor KIMURA Megumi:
Megumi KIMURA from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:
CHARGED PARTICLE BEAM INSPECTION SYSTEM AND CHARGED PARTICLE BEAM INSPECTION METHOD
#2 | 2022-02-17Electron beam observation device, electron beam observation system, and image correcting method and method for calculating correction factor for image correction in electron beam observation device
#3 | 2021-04-29Electron beam observation device, electron beam observation system, and control method of electron beam observation device
#4 | 2019-09-19Electron beam device and sample inspection method
#5 | 2018-09-13Charged particle beam device
#6 | 2014-10-09Endoscope treatment tool
#7 | 2013-02-28TREATMENT INSTRUMENT FOR ENDOSCOPE
#8 | 2012-08-09Treatment tool for endoscope
#9 | 2012-05-31High-frequency treatment instrument
#10 | 2012-03-29Treatment instrument for endoscope
#11 | 2012-02-02Endoscopic treatment tool
#12 | 2011-10-06TREATMENT TOOL
#13 | 2011-04-28HIGH-FREQUENCY TREATMENT INSTRUMENT
#14 | 2010-12-09Method for manufacturing an endoscopic instrument
#15 | 2010-01-28HIGH-FREQUENCY TREATMENT INSTRUMENT
#16 | 2009-04-30Endoscopic instrument and method for manufacturing
#17 | 2009-01-29Endoscopic treatment tool
#18 | 2008-05-29High frequency treatment instrument
#19 | 2007-06-14Treatment tool for endoscope
#20 | 2007-01-25High-frequency treatment instrument
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