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Inventor profile of:

Yusuke Abe

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2025-02-20

Top Assignees for applications by Yusuke Abe

The entities that hold a legal rights for patent applications filed by inventor Abe Yusuke:

HITACHI HIGH-TECH CORPORATION 10 Tokyo, Japan
NAGANO KEIKI CO., LTD. 4 Tokyo, Japan
HITACHI HIGH-TECHNOLOGIES CORPORATION 4 Tokyo, Japan
Rakuten Asia Pte. Ltd. 1 Singapore, Singapore
HITACHI, LTD. 1 Tokyo, Japan
Shigemasa Osaki 1 Sandy, UT United States
Japanese Foundation For Cancer Research 1 Tokyo, Japan
Isao Nemoto 1 Chiba-Ken, Japan

Recent patent applications by Abe Yusuke

Yusuke Abe from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-02-20

US20250060678A1

Physics

Pattern Measurement Device and Pattern Measurement Method

#2 | 2024-11-07

US20240371601A1

Electricity

Charged Particle Beam System

#3 | 2024-06-13

US20240193666A1

Physics

INFORMATION PROCESSING SYSTEM, INFORMATION PROCESSING METHOD, AND INFORMATION PROCESSING PROGRAM

#4 | 2023-09-14

US20230290606A1

Electricity

Charged Particle Beam Device

#5 | 2023-03-02

US20230064202A1

Electricity

CHARGED PARTICLE BEAM DEVICE

#6 | 2022-11-03

US20220351938A1

Electricity

Charged particle beam system

#7 | 2022-08-18

US20220260930A1

Physics

Pattern measurement device and pattern measurement method

#8 | 2022-04-28

US20220130638A1

Electricity

Charged particle beam device

#9 | 2021-12-09

US20210384006A1

Electricity

Electron microscope and method of adjusting focus of electron microscope

#10 | 2021-09-02

US20210272770A1

Electricity

Scanning electron microscope

#11 | 2021-05-06

US20210131801A1

Physics

Calibration sample, electron beam adjustment method and electron beam apparatus using same

#12 | 2021-02-11

US20210043420A1

Electricity

Scanning electron microscope and method for measuring pattern

#13 | 2020-10-08

US20200321189A1

Electricity

Pattern cross-sectional shape estimation system and program

#14 | 2020-10-01

US20200309627A1

Physics

Physical quantity measurement including improved corrosion protection

#15 | 2020-09-03

US20200278615A1

Physics

Pattern measurement device and pattern measurement method

#16 | 2020-07-23

US20200234916A1

Electricity

Scanning electron microscope and calculation method for three-dimensional structure depth

#17 | 2019-03-28

US20190094207A1

Physics

Screening method of anticancer agent focused on function of HP1 and evaluation system

#18 | 2019-02-28

US20190066969A1

Electricity

Charged particle beam apparatus

#19 | 2017-10-19

US20170299453A1

Physics

Ceramic sensor module including diaphragm and cylindrical portion integrated with the diaphragm

#20 | 2017-06-01

US20170153157A1

Physics

Physical quantity measuring device including a sensor module and a joint for locking the sensor module

#21 | 2015-12-17

US20150365010A1

Electricity

Power converter installed between an electric power system and an energy storage device

#22 | 2015-08-06

US20150221471A1

Electricity

Charged particle beam apparatus and image forming method

#23 | 2015-06-11

US20150160085A1

Physics

Physical quantity measuring sensor including an O-ring between a cylindrical portion and a cylindrical projection

#24 | 2005-11-24

US20050261543A1

Human necessities

Implantable artificial ventricular assist device

#25 | 2005-09-27

US10702906

Artificial heart-lung apparatus

InventorID:

1188537 ⎘