Akira Nambu

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2017-11-30

Top Assignees for applications by Akira Nambu

The entities that hold a legal rights for patent applications filed by inventor Nambu Akira:

Akira Nambu from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

Scanning probe microscope and its sample holder

HOLDER FOR PROBE MICROSCOPE, PROBE MICROSCOPE AND SPECIMEN MEASUREMENT METHOD

Scanning probe microscope and measuring method using same

InventorID:

1206155 ⎘