Yan Ren

City:

Delft

Country:

Netherlands

Published Applications:

Last publication date:

2020-01-30

Top Assignees for applications by Yan Ren

The entities that hold a legal rights for patent applications filed by inventor Ren Yan:

Yan Ren from Delft, NL has applied for patents for these inventions. The list has both pending applications and granted patents:

Apparatus and method for inspecting a sample using a plurality of charged particle beams

Apparatus and method for inspecting a sample using a plurality of charged particle beams

Apparatus and method for inspecting a surface of a sample

InventorID:

1208190 ⎘