Patrick Mihelich

City:

Sunnyvale, California

Country:

United States

Published Applications:

Last publication date:

2018-07-26

Top Assignees for applications by Patrick Mihelich

The entities that hold a legal rights for patent applications filed by inventor Mihelich Patrick:

Patrick Mihelich from Sunnyvale, US has applied for patents for these inventions. The list has both pending applications and granted patents:

Electronic device localization based on imagery

Measuring dimension of object through visual odometry

Electronic device localization based on imagery

Methods and systems for calibrating sensors of a computing device

InventorID:

1220914 ⎘