Tokyo
Japan
17
2022-06-23
The entities that hold a legal rights for patent applications filed by inventor Koike Toru:
Toru Koike from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:
Projection apparatus
#2 | 2020-10-29Projection apparatus and control method thereof
#3 | 2020-03-19Control apparatus, control method and non-transitory computer-readable medium
#4 | 2020-01-30IMAGE PROJECTION APPARATUS CAPABLE OF PREVENTING IMAGE WHICH WOULD BE HINDRANCE TO VIEWING PRINTED MATERIAL FROM BEING PROJECTED ON PRINTED MATERIAL, CONTROL METHOD THEREFOR, AND STORAGE MEDIUM
#5 | 2018-09-27Image projection apparatus capable of preventing image which would be hindrance to viewing printed material from being projected on printed material, control method therefor, and storage medium
#6 | 2017-10-26Image capturing apparatus connectable to display apparatus, display apparatus connectable to external apparatus, and image processing apparatus performing image processing
#7 | 2016-09-29Image processing apparatus and control method thereof
#8 | 2015-07-30Image processing apparatus, image processing method, display apparatus, and control method for display apparatus for generating and displaying a combined image of a high-dynamic-range image and a low-dynamic-range image
#9 | 2013-03-07IMAGE PROCESSING APPARATUS AND CONTROL METHOD THEREOF
#10 | 2012-03-01Image processing apparatus configured to perform image processing for plural images and control method thereof
#11 | 2011-11-03Image processing apparatus and control method thereof
#12 | 2011-06-02Image processing apparatus and method of controlling the same
#13 | 2010-10-28Imaging apparatus
#14 | 2008-11-06Imaging apparatus
#15 | 2008-07-31Image pickup apparatus and control method for image pickup apparatus, image display apparatus and control method for image display apparatus, and recording medium
#16 | 2007-08-02Wireless communication apparatus and distance measuring method
#17 | 2005-07-14Dimension measurement method, method of manufacturing semiconductor device, dimension measurement apparatus and measurement mark
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