David G. Kirsch

City:

Durham, North Carolina

Country:

United States

Published Applications:

Last publication date:

2023-11-16

Top Assignees for applications by David G. Kirsch

The entities that hold a legal rights for patent applications filed by inventor Kirsch David G.:

David G. Kirsch from Durham, US has applied for patents for these inventions. The list has both pending applications and granted patents:

SYSTEM AND METHOD FOR LARGE FIELD OF VIEW, SINGLE CELL ANALYSIS

System and method for large field of view, single cell analysis

System and method for large field of view, single cell analysis

System and method for large field of view, single cell analysis

InventorID:

1245071 ⎘