Wappingers Falls, New York
United States
4
2018-08-16
The entities that hold a legal rights for patent applications filed by inventor Dechene Daniel J.:
Daniel J. Dechene from Wappingers Falls, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Dummy pattern addition to improve CD uniformity
#2 | 2016-02-02Patterning assist feature to mitigate reactive ion etch microloading effect
#3 | 2015-08-20MULTIPLE PATTERNING DESIGN WITH REDUCED COMPLEXITY
#4 | 2014-02-18Fin design level mask decomposition for directed self assembly
1264495 ⎘