Daejeon
South Korea
15
2023-06-01
The entities that hold a legal rights for patent applications filed by inventor Chegal Won:
Won Chegal from Daejeon, KR has applied for patents for these inventions. The list has both pending applications and granted patents:
Device and method for multi-reflection solution immersed silicon-based microchannel measurement
#2 | 2021-06-17Normal incidence ellipsometer and method for measuring optical properties of sample by using same
#3 | 2021-03-11High-sensitive biosensor chip using high extinction coefficient marker and dielectric substrate, measurement system, and measurement method
#4 | 2019-11-14Liquid immersion micro-channel measurement device and measurement method which are based on trapezoidal incident structure prism incident-type silicon
#5 | 2018-04-26Achromatic rotating-element ellipsometer and method for measuring mueller-matrix elements of sample using the same
#6 | 2018-04-12Oblique incidence, prism-incident, silicon-based, immersion microchannel-based measurement device and measurement method
#7 | 2016-06-16Rotating-element spectroscopic ellipsometer and method for measurement precision prediction of rotating-element spectroscopic ellipsometer, recording medium storing program for executing the same, and computer program stored in medium for executing the same
#8 | 2016-06-02Optical element rotation type Mueller-matrix ellipsometer and method for measuring Mueller-matrix of sample using the same
#9 | 2015-09-10Apparatus and method for simultaneously measuring characteristics of molecular junctions and refractive index of buffer solution
#10 | 2012-03-08Surface plasmon resonance sensor using vertical illuminating focused-beam ellipsometer
#11 | 2011-09-08Multi-channel surface plasmon resonance sensor using beam profile ellipsometry
#12 | 2011-03-31Measurement of Fourier coefficients using integrating photometric detector
#13 | 2010-12-23Minute measuring instrument for high speed and large area and method thereof
#14 | 2010-11-25Single polarizer focused-beam ellipsometer
#15 | 2010-02-25Focused-beam ellipsometer
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