Inventor profile of:

Daniel E. Grupp

City:

Palo Alto, California

Country:

United States

Published Applications:

27

Last publication date:

2021-09-30

Top Assignees for applications by Daniel E. Grupp

The entities that hold a legal rights for patent applications filed by inventor Grupp Daniel E.:

Recent patent applications by Grupp Daniel E.

Daniel E. Grupp from Palo Alto, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2021-09-30
US20210305392A1
Electricity

Method for depinning the Fermi level of a semiconductor at an electrical junction and devices incorporating such junctions

#2 | 2020-08-27
US20200273961A1
Electricity

Method for depinning the Fermi level of a semiconductor at an electrical junction and devices incorporating such junctions

#3 | 2020-08-27
US20200273960A1
Electricity

Method for depinning the Fermi level of a semiconductor at an electrical junction and devices incorporating such junctions

#4 | 2020-07-30
US20200243662A1
Electricity

Method for depinning the fermi level of a semiconductor at an electrical junction and devices incorporating such junctions

#5 | 2019-10-31
US20190334006A1
Electricity

Method for depinning the fermi level of a semiconductor at an electrical junction and devices incorporating such junctions

#6 | 2018-09-20
US20180269298A1
Electricity

Method for depinning the fermi level of a semiconductor at an electrical junction and devices incorporating such junctions

#7 | 2018-06-14
US20180166552A1
Electricity

Method for depinning the Fermi level of a semiconductor at an electrical junction and devices incorporating such junctions

#8 | 2018-02-01
US20180033862A1
Electricity

Method for depinning the fermi level of a semiconductor at an electrical junction and devices incorporating such junctions

#9 | 2016-12-22
US20160372564A1
Electricity

Method for depinning the Fermi level of a semiconductor at an electrical junction and devices incorporating such junctions

#10 | 2016-06-16
US20160172492A1
Electricity

Method for depinning the Fermi level of a semiconductor at an electrical junction and devices incorporating such junctions

#11 | 2016-06-16
US20160172491A1
Electricity

Method for depinning the fermi level of a semiconductor at an electrical junction and devices incorporating such junctions

#12 | 2015-10-08
US20150287800A1
Electricity

Method for depinning the fermi level of a semiconductor at an electrical junction and devices incorporating such junctions

#13 | 2012-11-08
US20120280294A1
Electricity

Method for depinning the Fermi level of a semiconductor at an electrical junction and devices incorporating such junctions

#14 | 2011-09-01
US20110210376A1
Electricity

Insulated gate field effect transistor having passivated schottky barriers to the channel

#15 | 2011-07-14
US20110169124A1
Electricity

Method for depinning the Fermi level of a semiconductor at an electrical junction and devices incorporating such junctions

#16 | 2011-05-26
US20110124170A1
Electricity

Process for fabricating a self-aligned deposited source/drain insulated gate field-effect transistor

#17 | 2011-01-13
US20110008953A1
Electricity

Method for making semiconductor insulated-gate field-effect transistor having multilayer deposited metal source(s) and/or drain(s)

#18 | 2009-04-23
US20090104770A1
Electricity

Method for depinning the fermi level of a semiconductor at an electrical junction and devices incorporating such junctions

#19 | 2007-09-27
US20070224739A1
Electricity

Method for making semiconductor insulated-gate field-effect transistor having multilayer deposited metal source(s) and/or drain(s)

#20 | 2007-02-01
US20070026591A1
Electricity

Insulated gate field effect transistor having passivated schottky barriers to the channel

#21 | 2006-09-26
US10754966
-

Insulated gate field effect transistor having passivated Schottky barriers to the channel

#22 | 2006-08-01
US10217758
-

Method for depinning the Fermi level of a semiconductor at an electrical junction and devices incorporating such junctions

#23 | 2006-04-20
US20060084232A1
Electricity

Process for fabricating a self-aligned deposited source/drain insulated gate field-effect transistor

#24 | 2005-11-10
US20050247956A1
Electricity

Method for depinning the Fermi level of a semiconductor at an electrical junction and devices incorporating such junctions

#25 | 2005-05-19
US20050104137A1
Electricity

Insulated gate field-effect transistor having III-VI source/drain layer(s)

#26 | 2005-05-10
US10832576
-

Transistor with workfunction-induced charge layer

#27 | 2005-05-05
US20050093027A1
Electricity

Method for depinning the Fermi level of a semiconductor at an electrical junction and devices incorporating such junctions

InventorID:

1317073 ⎘