Eiko Nakazawa

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2024-03-07

Top Assignees for applications by Eiko Nakazawa

The entities that hold a legal rights for patent applications filed by inventor Nakazawa Eiko:

Eiko Nakazawa from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

Microscope Slide and Method for Selecting the Same

Method of preparing biological tissue sample and method of observing biological tissue section sample

Specimen observation method

Charged particle device and wiring method

Charged particle device and wiring method

Observation specimen for use in electron microscopy, electron microscopy, electron microscope, and device for producing observation specimen

InventorID:

1330274 ⎘