Patents-Review.com
🔗 Permalink
Inventor profile of:

Alexander Henstra

City:

Utrecht

Country:

Netherlands

Published Applications:

27

Last publication date:

2026-06-11

Top Assignees for applications by Alexander Henstra

The entities that hold a legal rights for patent applications filed by inventor Henstra Alexander:

Recent patent applications by Henstra Alexander

Alexander Henstra from Utrecht, NL has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-06-11
US20260162925A1
Electricity

FOCUSED ION BEAM SYSTEMS INCLUDING MULTIPOLE ELEMENTS AND DECELERATION ELEMENTS

 #2 | 2026-05-14
US20260135059A1
Electricity

MODULAR OPTICAL BENCH ASSEMBLY

 #3 | 2026-01-15
US20260018365A1
Electricity

REDUCED BOERSCH EFFECT IN DISPERSIVE OPTICS

 #4 | 2025-12-25
US20250391649A1
Electricity

EELS Auto-Alignment Using Full Image Simulation

 #5 | 2025-12-25
US20250391629A1
Electricity

ABERRATION CORRECTION IN CHARGED PARTICLE SPECTROSCOPY

 #6 | 2025-04-03
US20250112019A1
Electricity

MULTIPOLE ELEMENTS AND CHARGED PARTICLE MICROSCOPE SYSTEMS INCLUDING THE SAME

 #7 | 2025-04-03
US20250112018A1
Electricity

ABERRATION CORRECTION SYSTEMS AND CHARGED PARTICLE MICROSCOPE SYSTEMS INCLUDING THE SAME

 #8 | 2025-04-03
US20250112016A1
Electricity

ABERRATION CORRECTION SYSTEMS AND CHARGED PARTICLE MICROSCOPE SYSTEMS INCLUDING THE SAME

 #9 | 2024-06-13
US20240194466A1
Electricity

EELS Auto-Alignment Using Full Image Simulation

 #10 | 2024-02-08
US20240047171A1
Electricity

Charged particle optics components and their fabrication

 #11 | 2024-02-08
US20240047170A1
Electricity

Simple Spherical Aberration Corrector for SEM

 #12 | 2024-02-08
US20240047169A1
Electricity

Simple Spherical Aberration Corrector for SEM

 #13 | 2020-11-26
US20200373115A1
Electricity

MULTI-BEAM SCANNING ELECTRON MICROSCOPE

 #14 | 2018-11-08
US20180323036A1
Electricity

Gun lens design in a charged particle microscope

 #15 | 2018-09-06
US20180254169A1
Electricity

Post column filter with enhanced energy range

 #16 | 2018-09-06
US20180254168A1
Electricity

Aberration measurement in a charged particle microscope

 #17 | 2017-08-03
US20170221673A1
Electricity

Charged-particle microscope with astigmatism compensation and energy-selection

 #18 | 2017-05-04
US20170125210A1
Electricity

Post column filter with enhanced energy range

 #19 | 2015-02-12
US20150041647A1
Electricity

Method of using an environmental transmission electron microscope

 #20 | 2014-04-17
US20140103225A1
Electricity

Beam pulsing device for use in charged-particle microscopy

 #21 | 2013-03-14
US20130062520A1
Electricity

Distortion free stigmation of a TEM

 #22 | 2012-05-10
US20120112090A1
Electricity

Charged particle source with integrated electrostatic energy filter

 #23 | 2011-11-24
US20110284763A1
Electricity

Charged particle source with integrated energy filter

 #24 | 2011-05-19
US20110114852A1
Electricity

Corrector for axial aberrations of a particle-optical lens

 #25 | 2010-09-09
US20100224592A1
Electricity

Charged particle beam processing

 #26 | 2009-11-26
US20090289195A1
Electricity

Charged particle source with integrated energy filter

 #27 | 2008-11-27
US20080290264A1
Electricity

Corrector for the correction of chromatic aberrations in a particle-optical apparatus
InventorID:

134405 ⎘