Eindhoven
Netherlands
12
2015-06-18
The entities that hold a legal rights for patent applications filed by inventor Luecken Uwe:
Uwe Luecken from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:
Method of investigating the wavefront of a charged-particle beam
#2 | 2014-05-29Method of performing tomographic imaging of a sample in a charged-particle microscope
#3 | 2013-11-28Method of Preparing a Biological Sample for Inspection with Electron Microscopy and Fluorescent Light Microscopy
#4 | 2013-04-18Method for acquiring data with an image sensor
#5 | 2013-03-14Distortion free stigmation of a TEM
#6 | 2012-05-24Method of measuring the temperature of a sample carrier in a charged particle-optical apparatus
#7 | 2012-03-01Detector system for transmission electron microscope
#8 | 2012-03-01Detector system for use with transmission electron microscope spectroscopy
#9 | 2011-11-03Method of using a direct electron detector for a TEM
#10 | 2010-03-25Method of use for a multipole detector for a transmission electron microscope
#11 | 2009-05-21Method for obtaining a scanning transmission image of a sample in a particle-optical apparatus
#12 | 2009-01-01Method for attaching a sample to a manipulator by melting and then freezing part of said sample
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