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Inventor profile of:

John Changala

City:

Tustin, California

Country:

United States

Published Applications:

Last publication date:

2025-05-15

Top Assignees for applications by John Changala

The entities that hold a legal rights for patent applications filed by inventor Changala John:

FemtoMetrix, Inc. 6 Irvine, CA United States
FemtoMetrix, Inc. 2 Los Angeles, CA United States

Recent patent applications by Changala John

John Changala from Tustin, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-05-15

US20250155486A1

Physics

WAFER METROLOGY TECHNOLOGIES

#2 | 2022-12-29

US20220413029A1

Physics

Wafer metrology technologies

#3 | 2022-08-18

US20220260626A1

Physics

Pump and probe type second harmonic generation metrology

#4 | 2021-02-25

US20210055338A1

Physics

Pump and probe type second harmonic generation metrology

#5 | 2020-12-24

US20200400732A1

Physics

Wafer metrology technologies

#6 | 2020-11-05

US20200348348A1

Physics

Field-biased second harmonic generation metrology

#7 | 2018-10-18

US20180299497A1

Physics

Pump and probe type second harmonic generation metrology

#8 | 2018-10-11

US20180292441A1

Physics

CHARGE DECAY MEASUREMENT SYSTEMS AND METHODS

#9 | 2018-08-02

US20180217193A1

Physics

Wafer metrology technologies

#10 | 2018-08-02

US20180217192A1

Physics

Field-biased second harmonic generation metrology

#11 | 2015-11-19

US20150331036A1

Physics

FIELD-BIASED SECOND HARMONIC GENERATION METROLOGY

#12 | 2015-11-19

US20150331029A1

Physics

CHARGE DECAY MEASUREMENT SYSTEMS AND METHODS

#13 | 2015-11-19

US20150330909A1

Physics

WAFER METROLOGY TECHONOLOGIES

#14 | 2015-11-19

US20150330908A1

Physics

PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY

InventorID:

1361821 ⎘