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Inventor profile of:

Hirohiko KITSUKI

City:

Tokyo

Country:

Japan

Published Applications:

8

Last publication date:

2025-09-11

Top Assignees for applications by Hirohiko KITSUKI

The entities that hold a legal rights for patent applications filed by inventor KITSUKI Hirohiko:

HITACHI HIGH-TECH CORPORATION 7 Tokyo, Japan
HITACHI HIGH-TECHNOLOGIES CORPORATION 1 Tokyo, Japan

Recent patent applications by KITSUKI Hirohiko

Hirohiko KITSUKI from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-09-11

US20250285261A1

SAMPLE OBSERVATION METHOD

#2 | 2023-08-31

US20230274909A1

Charged Particle Beam Device

#3 | 2023-07-27

US20230238290A1

DEFECT OBSERVATION METHOD, APPARATUS, AND PROGRAM

#4 | 2022-01-27

US20220028652A1

Charged particle beam apparatus

#5 | 2021-06-03

US20210166911A1

Charged particle beam system, method for determining range for automatically searching for focal point position in charged particle beam device, and non-transitory storage medium recording program for causing computer system to determine range for automatically searching for focal position in charged particle beam device

#6 | 2020-10-08

US20200321189A1

Pattern cross-sectional shape estimation system and program

#7 | 2020-07-23

US20200234916A1

Scanning electron microscope and calculation method for three-dimensional structure depth

#8 | 2015-11-19

US20150332445A1

Defect observation method and defect observation device

InventorID:

1363345 ⎘