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Inventor profile of:

Stefan Meyer

City:

Aalen

Country:

Germany

Published Applications:

8

Last publication date:

2021-02-18

Top Assignees for applications by Stefan Meyer

The entities that hold a legal rights for patent applications filed by inventor Meyer Stefan:

  • CARL ZEISS MICROSCOPY GMBH 7 Jena, Germany
  • CARL ZEISS NTS GMBH 1 Oberkochen, Germany

Recent patent applications by Meyer Stefan

Stefan Meyer from Aalen, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2021-02-18
US20210050178A1
Electricity

Charged particle optical apparatus for through-the-lens detection of particles

#2 | 2020-04-30
US20200135425A1
Electricity

Charged particle optical apparatus for through-the-lens detection of particles

#3 | 2019-10-03
US20190304742A1
Electricity

Electron beam microscope

#4 | 2018-11-29
US20180342368A1
Electricity

Charged particle optical apparatus for through-the-lens detection of particles

#5 | 2017-06-01
US20170154752A1
Electricity

Charged particle optical apparatus for through-the lens detection of particles

#6 | 2015-12-03
US20150348742A1
Electricity

Charged particle optical apparatus having a selectively positionable differential pressure module

#7 | 2012-12-27
US20120326032A1
Electricity

Particle beam microscope

#8 | 2012-12-27
US20120326030A1
Electricity

Particle Beam Microscope

InventorID:

1379656 ⎘

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