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Inventor profile of:

KWUN JONG CHEN

City:

Country:

United States

Published Applications:

1

Last publication date:

2015-12-17

Recent patent applications by CHEN KWUN JONG

KWUN JONG CHEN from , US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2015-12-17

US20150362548A1

WAFER MAP IDENTIFICATION SYSTEM FOR WAFER TEST DATA

InventorID:

1393987 ⎘