Inventor profile of:

Dae Won Moon

City:

Daejeon

Country:

South Korea

Published Applications:

12

Last publication date:

2014-07-03

Top Assignees for applications by Dae Won Moon

The entities that hold a legal rights for patent applications filed by inventor Moon Dae Won:

Recent patent applications by Moon Dae Won

Dae Won Moon from Daejeon, KR has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2014-07-03
US20140183354A1
Electricity

Flight time based mass microscope system for ultra high-speed multi mode mass analysis

#2 | 2013-03-14
US20130065266A1
Physics

Disease diagnosis method, marker screening method and marker using TOF-SIMS

#3 | 2012-03-01
US20120050720A1
Physics

SYSTEM FOR DIAGNOSING PATHOLOGICAL CHANGE OF LIPID IN BLOOD VESSELS USING NON-LINEAR OPTICAL MICROSCOPY

#4 | 2011-07-07
US20110163228A1
Physics

Quantification method of functional groups of organic layer

#5 | 2011-06-23
US20110152119A1
Physics

Quantification Method of Biochemical Substances Using Ion Scattering Spectroscopy and Specific-Binding Efficiency Quantification Method of Biochemical Substances Using Ion Scattering Spectroscopy

#6 | 2011-06-09
US20110133081A1
Physics

Spectrophotometer using medium energy ion

#7 | 2011-05-05
US20110101217A1
Physics

Mass Spectrometric Method for Matrix-Free Laser Desorption/Ionization of Self-Assembled Monolayers

#8 | 2011-04-28
US20110095179A1
Physics

Disease diagnosis method, marker screening method and marker using TOF-SIMS

#9 | 2010-07-08
US20100174145A1
Human necessities

Spectrally encoded coherent ant-stokes raman scattering endoscope

#10 | 2010-01-28
US20100020318A1
Physics

3-color multiplex CARS spectrometer

#11 | 2009-06-11
US20090148862A1
Physics

Evaluation method of organic or bio-conjugation on nanoparticles using imaging of time-of-flight secondary ion mass spectrometry

#12 | 2008-03-27
US20080076676A1
Physics

Construction of gold nanoparticle-based peptide chip, and assaying enzyme activity and inhibitor effect using secondary ion mass spectrometric analysis thereof

InventorID:

139711 ⎘