Nagoya
Japan
22
2021-09-23
The entities that hold a legal rights for patent applications filed by inventor USUI Satoshi:
Satoshi USUI from Nagoya, JP has applied for patents for these inventions. The list has both pending applications and granted patents:
Semiconductor manufacturing apparatus and method of manufacturing semiconductor device
#2 | 2021-08-05Leading system, leading device, and control method of leading system
#3 | 2021-05-13Relay device, storage medium storing program for relay device, and control method of relay device
#4 | 2020-09-17Semiconductor storage device and method for manufacturing semiconductor storage device
#5 | 2020-07-30Notification system, notification device, and notification method
#6 | 2020-05-07Leading system, leading device, and control method of leading system
#7 | 2019-08-08Imprint apparatus and method of manufacturing semiconductor device
#8 | 2019-06-27Parking assistance service management device, parking assistance service use support method, parking assistance service management method, and non-transitory computer-readable storage medium
#9 | 2019-06-27Management system of substitute parking service, method of assisting use of substitute parking service, and non-transitory computer-readable storage medium storing management programs
#10 | 2019-06-20Parking assistance service management device, agent terminal, management method, and non-transitory computer-readable storage medium
#11 | 2019-06-20Parking assistance service management device, control method for same, control method for terminal of user, and non-transitory computer-readable storage medium
#12 | 2019-05-30Notification system, notification device, and notification method
#13 | 2019-05-30Leading system, leading device, and control method of leading system
#14 | 2019-05-30Relay device, storage medium storing program for relay device, and control method of relay device
#15 | 2018-06-07Manufacturing method of photomask and recording medium
#16 | 2017-11-16Layout method of mask pattern, manufacturing method of a semiconductor device and exposure mask
#17 | 2017-08-17Substrate measurement system, method of measuring substrate, and computer program product
#18 | 2017-02-09Pattern outline extraction device, pattern outline extraction method, and computer program product
#19 | 2016-08-18Mask data generation system, mask data generation method, and recording medium
#20 | 2016-06-16SEMICONDUCTOR INSPECTION APPARATUS, SEMICONDUCTOR INSPECTION METHOD, AND RECORDING MEDIUM
#21 | 2015-12-31Mask data generation method, mask data generation system, and recording medium
#22 | 2014-10-14Inspection data generator, inspection data generating method and pattern inspecting method
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