Inventor profile of:

Koichiro NOGUCHI

City:

Tokyo

Country:

Japan

Published Applications:

18

Last publication date:

2026-03-05

Top Assignees for applications by Koichiro NOGUCHI

The entities that hold a legal rights for patent applications filed by inventor NOGUCHI Koichiro:

Recent patent applications by NOGUCHI Koichiro

Koichiro NOGUCHI from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-03-05
US20260068722A1
Electricity

SEMICONDUCTOR MODULE AND METHOD OF MANUFACTURING SEMICONDUCTOR MODULE

#2 | 2020-12-24
US20200403612A1
Electricity

Semiconductor module and semiconductor package

#3 | 2020-06-18
US20200194353A1
Electricity

Package and terminal arrangement for semiconductor module

#4 | 2019-12-12
US20190379370A1
Electricity

Power semiconductor device

#5 | 2019-10-24
US20190326897A1
Electricity

Driving device for semiconductor element

#6 | 2019-03-21
US20190089351A1
Electricity

Power module

#7 | 2018-11-08
US20180323779A1
Electricity

Semiconductor device

#8 | 2018-03-22
US20180083494A1
Electricity

Power supply device, and control method of power supply device

#9 | 2017-10-19
US20170300329A1
Physics

INSTRUCTION EXECUTION CONTROL SYSTEM AND INSTRUCTION EXECUTION CONTROL METHOD

#10 | 2016-12-15
US20160364351A1
Physics

Semiconductor device, semiconductor system including the same, control method of semiconductor device, and check list generation program

#11 | 2016-05-12
US20160132040A1
Physics

CONNECTION RELATION DETECTING SYSTEM, INFORMATION PROCESSING APPARATUS, AND CONNECTION RELATION DETECTING METHOD

#12 | 2016-03-03
US20160065070A1
Electricity

Semiconductor device

#13 | 2012-02-02
US20120025790A1
Physics

ELECTRONIC CIRCUIT, CIRCUIT APPARATUS, TEST SYSTEM, CONTROL METHOD OF THE ELECTRONIC CIRCUIT

#14 | 2012-01-26
US20120018726A1
Electricity

SEMICONDUCTOR WAFER AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

#15 | 2011-10-27
US20110260747A1
Physics

Semiconductor device and method of testing the same

#16 | 2010-12-23
US20100321054A1
Physics

Semiconductor inspecting device and semiconductor inspecting method

#17 | 2010-12-23
US20100321053A1
Physics

Semiconductor inspection apparatus, semiconductor wafer positioning method, and semiconductor wafer inspection method

#18 | 2010-11-11
US20100283497A1
Physics

Semiconductor testing device, semiconductor device, and testing method

InventorID:

1463695 ⎘