Tokyo
Japan
14
2025-03-06
The entities that hold a legal rights for patent applications filed by inventor HIMEDA Akihiro:
Akihiro HIMEDA from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:
INFORMATION PROCESSING SYSTEM, INFORMATION PROCESSING METHOD AND PROGRAM
#2 | 2024-04-25PROCESSING APPARATUS, SYSTEM, METHOD, AND PROGRAM FOR APPLYING NON-NEGATIVE MATRIX FACTORIZATION TO A MEASURED PROFILE OF X-RAY POWDER DIFFRACTION
#3 | 2023-06-22INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, NONTRANSITORY COMPUTER READABLE MEDIA STORING PROGRAM, AND X-RAY ANALYSIS APPARATUS
#4 | 2023-06-15INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, NON-TRANSITORY COMPUTER READABLE MEDIA STORING PROGRAM, AND X-RAY ANALYSIS APPARATUS
#5 | 2022-12-08Quantitative analysis apparatus, method and program and manufacturing control system
#6 | 2019-02-28Method for displaying measurement results from x-ray diffraction measurement
#7 | 2019-02-07Analysis apparatus, analysis method and analysis program
#8 | 2018-12-20Quantitative phase analysis device, quantitative phase analysis method, and quantitative phase analysis program
#9 | 2017-12-28Processing method, processing apparatus and processing program configured to determine conditions of pole figure measurement by X-ray diffraction
#10 | 2017-11-30Crystalline phase identification method, crystalline phase identification device, and X-ray diffraction measurement system
#11 | 2017-11-23Operation guide system for X-ray analysis,operation guide method therefor, and operation guide program therefor
#12 | 2014-09-18CRYSTALLINE PHASE IDENTIFICATION METHOD, CRYSTALLINE PHASE IDENTIFICATION DEVICE, AND CRYSTALLINE PHASE IDENTIFICATION PROGRAM
#13 | 2013-03-28Analysis method for X-ray diffraction measurement data
#14 | 2005-10-06Method and apparatus for film thickness measurement
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