Hsin-chu
Taiwan
23
2020-08-06
The entities that hold a legal rights for patent applications filed by inventor Lin Hung-Chih:
Hung-Chih Lin from Hsin-chu, TW has applied for patents for these inventions. The list has both pending applications and granted patents:
VIDEO PROCESSING METHOD FOR BLOCKING IN-LOOP FILTERING FROM BEING APPLIED TO AT LEAST ONE BOUNDARY IN RECONSTRUCTED FRAME AND ASSOCIATED VIDEO PROCESSING APPARATUS
#2 | 2020-07-16Method and apparatus for decoding projection based frame with 360-degree content represented by triangular projection faces packed in triangle-based projection layout
#3 | 2020-07-02Method and apparatus for generating projection-based frame with 360-degree image content represented by triangular projection faces assembled in triangle-based projection layout
#4 | 2020-06-18Method and apparatus for reduction of artifacts at discontinuous boundaries in coded virtual-reality images
#5 | 2019-10-24Method and apparatus for decoding projection-based frame with 360-degree content represented by triangular projection faces packed in octahedron projection layout
#6 | 2019-02-28Method and apparatus of signalling syntax for immersive video coding
#7 | 2019-01-24Method and apparatus for reduction of artifacts at discontinuous boundaries in coded virtual-reality images
#8 | 2018-04-05Method and Apparatus for Rearranging VR Video Format and Constrained Encoding Parameters
#9 | 2016-03-17Integrated fan-out pillar probe system
#10 | 2015-12-31Circuit probing structures and methods for probing the same
#11 | 2015-03-263D IC testing apparatus
#12 | 2014-12-11Method and apparatus of wafer testing
#13 | 2014-06-26Apparatus for three dimensional integrated circuit testing
#14 | 2013-06-13Circuit probing structures and methods for probing the same
#15 | 2013-04-25Probe cards for probing integrated circuits
#16 | 2013-03-28Production flow and reusable testing method
#17 | 2012-11-153D IC testing apparatus
#18 | 2012-10-11Dynamic testing based on thermal and stress conditions
#19 | 2012-09-27Adaptive test sequence for testing integrated circuits
#20 | 2012-09-27Power compensation in 3DIC testing
#21 | 2011-12-08BACKLIGHT MODULE AND HEAT DISSIPATION MODULE
#22 | 2011-03-24BACKLIGHT MODULE
#23 | 2008-02-21Inverter and inverter unit thereof
166313 ⎘