Luzhou City
Taiwan
13
2015-05-14
The entities that hold a legal rights for patent applications filed by inventor Chen Hao:
Hao Chen from Luzhou City, TW has applied for patents for these inventions. The list has both pending applications and granted patents:
Systems for probing semiconductor wafers
#2 | 2014-12-11Method and apparatus of wafer testing
#3 | 2014-06-26Apparatus for three dimensional integrated circuit testing
#4 | 2013-08-01Method of testing through silicon VIAS (TSVs) of three dimensional integrated circuit (3DIC)
#5 | 2013-06-13Circuit probing structures and methods for probing the same
#6 | 2013-04-25Probe cards for probing integrated circuits
#7 | 2013-04-25Methods for probing semiconductor wafers
#8 | 2013-03-28Production flow and reusable testing method
#9 | 2012-11-153D IC testing apparatus
#10 | 2012-10-11Dynamic testing based on thermal and stress conditions
#11 | 2012-09-27Adaptive test sequence for testing integrated circuits
#12 | 2012-09-27Power compensation in 3DIC testing
#13 | 2012-04-26Test structures for through silicon vias (TSVs) of three dimensional integrated circuit (3DIC)
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