Inventor profile of:

David W. Minsek

City:

New Milford, Connecticut

Country:

United States

Published Applications:

19

Last publication date:

2016-06-02

Top Assignees for applications by David W. Minsek

The entities that hold a legal rights for patent applications filed by inventor Minsek David W.:

Recent patent applications by Minsek David W.

David W. Minsek from New Milford, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2016-06-02
US20160152926A1
Chemistry; metallurgy

PHOTORESIST REMOVAL

#2 | 2015-09-17
US20150259816A1
Chemistry; metallurgy

Electroplating of metals on conductive oxide substrates

#3 | 2015-04-02
US20150094248A1
Chemistry; metallurgy

Metal and dielectric compatible sacrificial anti-reflective coating cleaning and removal composition

#4 | 2015-01-01
US20150000697A1
Electricity

Oxidizing aqueous cleaner for the removal of post-etch residues

#5 | 2014-07-31
US20140213498A1
Physics

Photoresist removal

#6 | 2013-03-28
US20130078754A1
Electricity

Light induced plating of metals on silicon photovoltaic cells

#7 | 2012-11-29
US20120302483A1
Chemistry; metallurgy

Photoresist removal

#8 | 2011-11-10
US20110275175A1
Chemistry; metallurgy

Light induced plating of metals on silicon photovoltaic cells

#9 | 2011-08-04
US20110186086A1
Electricity

Oxidizing aqueous cleaner for the removal of post-etch residues

#10 | 2010-07-01
US20100163788A1
Chemistry; metallurgy

LIQUID CLEANER FOR THE REMOVAL OF POST-ETCH RESIDUES

#11 | 2010-05-06
US20100112728A1
Electricity

METHODS FOR STRIPPING MATERIAL FOR WAFER RECLAMATION

#12 | 2009-08-27
US20090215659A1
Physics

Composition useful for removal of post-etch photoresist and bottom anti-reflection coatings

#13 | 2009-08-27
US20090215658A1
Electricity

Oxidizing aqueous cleaner for the removal of post-etch residues

#14 | 2009-07-30
US20090192065A1
Chemistry; metallurgy

DENSE FLUID COMPOSITIONS FOR REMOVAL OF HARDENED PHOTORESIST, POST-ETCH RESIDUE AND/OR BOTTOM ANTI-REFLECTIVE COATING

#15 | 2009-02-05
US20090032766A1
Electricity

COMPOSITION AND METHOD FOR SELECTIVELY ETCHING GATE SPACER OXIDE MATERIAL

#16 | 2008-10-02
US20080242574A1
Chemistry; metallurgy

Metal and dielectric compatible sacrificial anti-reflective coating cleaning and removal composition

#17 | 2008-03-06
US20080058238A1
Physics

SUPERCRITICAL FLUID CLEANING OF SEMICONDUCTOR SUBSTRATES

#18 | 2006-07-13
US20060154186A1
Physics

Composition useful for removal of post-etch photoresist and bottom anti-reflection coatings

#19 | 2006-03-23
US20060063687A1
Chemistry; metallurgy

Composition and process for ashless removal of post-etch photoresist and/or bottom anti-reflective material on a substrate

InventorID:

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