David Pirkle

City:

Soquel, California

Country:

United States

Published Applications:

Last publication date:

2016-10-06

Top Assignees for applications by David Pirkle

The entities that hold a legal rights for patent applications filed by inventor Pirkle David:

David Pirkle from Soquel, US has applied for patents for these inventions. The list has both pending applications and granted patents:

METHOD AND APPARATUS FOR DETECTING DEFECTS ON WAFERS

Methods and apparatus for sensing unconfinement in a plasma processing chamber

Apparatus and methods for the detection of an arc in a plasma processing system

InventorID:

1674495 ⎘