Michael Hilbert

City:

Jena

Country:

Germany

Published Applications:

Last publication date:

2021-04-22

Top Assignees for applications by Michael Hilbert

The entities that hold a legal rights for patent applications filed by inventor Hilbert Michael:

Michael Hilbert from Jena, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

Method for scanning microscopy and scanning microscope

Method for scanning microscopy and scanning microscope

Microscope for Measuring Total Reflection Fluorescence

METHOD OF DETERMINING A MEASUREMENT VALUE ON THE BASIS OF SINGLE MOLECULE EVENTS

InventorID:

1679781 ⎘