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Inventor profile of:

SEBASTIAN FLACKE

City:

EINDHOVEN

Country:

Netherlands

Published Applications:

1

Last publication date:

2016-10-20

Recent patent applications by FLACKE SEBASTIAN

SEBASTIAN FLACKE from EINDHOVEN, NL has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2016-10-20

US20160306023A1

SYSTEM FOR MEASURING CORTICAL THICKNESS FROM MR SCAN INFORMATION

InventorID:

1685859 ⎘