Inventor profile of:

Itai Jaeger

City:

Lavon

Country:

Israel

Published Applications:

15

Last publication date:

2013-08-01

Top Assignees for applications by Itai Jaeger

The entities that hold a legal rights for patent applications filed by inventor Jaeger Itai:

Recent patent applications by Jaeger Itai

Itai Jaeger from Lavon, IL has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2013-08-01
US20130196305A1
Physics

METHOD AND APPARATUS FOR GENERATING QUESTIONS

#2 | 2013-03-28
US20130080363A9
Physics

CONTEXT-BASED FAILURE REPORTING FOR A CONSTRAINT SATISFACTION PROBLEM

#3 | 2010-12-09
US20100312738A1
Physics

Context-based failure reporting for a constraint satisfaction problem

#4 | 2010-01-14
US20100010950A1
Physics

Determining compliance rates for probabilistic requests

#5 | 2009-12-17
US20090313590A1
Physics

Highly specialized scenarios in random test generation

#6 | 2008-10-16
US20080255822A1
Physics

Automatic generation of test suite for processor architecture compliance

#7 | 2008-08-07
US20080189230A1
Physics

DETERMINING COMPLIANCE RATES FOR PROBABILISTIC REQUESTS

#8 | 2008-08-07
US20080189094A1
Physics

Systematic compliance checking of a process

#9 | 2008-07-24
US20080177968A1
Physics

Random stimuli generation of memory maps and memory allocations

#10 | 2007-11-22
US20070271207A1
Physics

Determining compliance rates for probabilistic requests

#11 | 2007-11-01
US20070255667A1
Physics

Context-based failure reporting for a constraint satisfaction problem

#12 | 2007-04-26
US20070094184A1
Chemistry; metallurgy

System and method and product of manufacture for automated test generation via constraint satisfaction with duplicated sub-problems

#13 | 2007-01-11
US20070011631A1
Physics

Harnessing machine learning to improve the success rate of stimuli generation

#14 | 2006-09-28
US20060218513A1
Physics

Dynamically interleaving randomly generated test-cases for functional verification

#15 | 2006-09-21
US20060212756A1
Physics

Highly specialized scenarios in random test generation

InventorID:

169569 ⎘