Inventor profile of:

Lin Zhou

City:

Eagan, Minnesota

Country:

United States

Published Applications:

18

Last publication date:

2016-08-11

Top Assignees for applications by Lin Zhou

The entities that hold a legal rights for patent applications filed by inventor Zhou Lin:

Recent patent applications by Zhou Lin

Lin Zhou from Eagan, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2016-08-11
US20160232931A1
Physics

Concurrent modulation and frictional heating head disk contact detection

#2 | 2016-01-28
US20160025772A1
Physics

Atomic force microscopy of scanning and image processing

#3 | 2015-04-16
US20150103432A1
Physics

Methods and devices for head-media contact detection

#4 | 2014-09-18
US20140269241A1
Physics

High sample rate dPES to improve contact detection signal to noise ratio

#5 | 2014-09-11
US20140254344A1
Physics

Contact detection

#6 | 2014-09-11
US20140254341A1
Physics

Friction force measurement assembly and method

#7 | 2014-09-11
US20140254040A1
Physics

Head-medium contact detection using introduced heat oscillation

#8 | 2013-03-28
US20130081159A1
Physics

ADVANCED ATOMIC FORCE MICROSCOPY SCANNING FOR OBTAINING A TRUE SHAPE

#9 | 2012-11-29
US20120300335A1
Physics

Tribological monitoring of a data storage device

#10 | 2012-08-30
US20120218659A1
Physics

Contact detection

#11 | 2012-03-29
US20120079635A1
Performing operations; transporting

Methods and devices for correcting errors in atomic force microscopy

#12 | 2012-02-16
US20120042422A1
Physics

Variable pixel density imaging

#13 | 2011-06-09
US20110138505A1
Physics

Scanning probe microscopy employing correlation pattern recognition

#14 | 2011-01-13
US20110007423A1
Physics

Supplemental Layer to Reduce Damage from Recording Head to Recording Media Contact

#15 | 2010-09-16
US20100235956A1
Physics

Atomic force microscopy true shape measurement method

#16 | 2008-11-13
US20080276696A1
Physics

Atomic force microscopy of scanning and image processing

#17 | 2008-11-06
US20080273260A1
Physics

Method and apparatus for detecting proximity contact between a transducer and a medium

#18 | 2007-11-01
US20070251306A1
Physics

Atomic force microscopy scanning and image processing

InventorID:

170906 ⎘