Dirk Naumann

City:

Lorsch

Country:

Germany

Published Applications:

Last publication date:

2016-11-17

Top Assignees for applications by Dirk Naumann

The entities that hold a legal rights for patent applications filed by inventor Naumann Dirk:

Dirk Naumann from Lorsch, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

Method and X-ray inspection system, in particular for non-destructively inspecting objects

Dynamic control of radiation emission

Transport bin in an X-ray inspection system

Method and apparatus for detecting a particular material in an object by means of electromagnetic radiation

Method and device for detecting a given material in an object using electromagnetic rays

InventorID:

1712405 ⎘