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Inventor profile of:

Yuusuke OOMINAMI

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2025-02-27

Top Assignees for applications by Yuusuke OOMINAMI

The entities that hold a legal rights for patent applications filed by inventor OOMINAMI Yuusuke:

HITACHI HIGH-TECHNOLOGIES CORPORATION 5 Tokyo, Japan
HITACHI HIGH-TECH CORPORATION 3 Tokyo, Japan
Hitachi High-Technologies Corporation 1 Minato-ku, TOKYO, Japan

Recent patent applications by OOMINAMI Yuusuke

Yuusuke OOMINAMI from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-02-27

US20250066835A1

Chemistry; metallurgy

Microbial Image Analysis Method

#2 | 2024-07-04

US20240219286A1

Physics

Particle Analysis Device and Particle Analysis Method

#3 | 2024-06-20

US20240201113A1

Physics

PARTICLE ANALYZING DEVICE, AND PARTICLE ANALYZING METHOD

#4 | 2021-09-02

US20210269847A1

Chemistry; metallurgy

Chemical Susceptibility Inspection Method

#5 | 2021-07-29

US20210233740A1

Electricity

Charged Particle Microscope and Method of Imaging Sample

#6 | 2021-06-17

US20210181127A1

Physics

Cell analysis apparatus and cell analysis method

#7 | 2020-09-03

US20200278303A1

Physics

Support system for specified inspection, support method for specified inspection, and non-transitory computer readable medium

#8 | 2019-12-12

US20190378687A1

Electricity

Charged particle beam device

#9 | 2018-06-21

US20180174796A1

Electricity

Method for adjusting height of sample and observation system

#10 | 2017-11-16

US20170330724A1

Electricity

Charged particle beam device

#11 | 2017-03-09

US20170069458A1

Electricity

Sample holder with light emitting and transferring elements for a charged particle beam apparatus

#12 | 2016-11-24

US20160343538A1

Electricity

Electron scanning microscope and image generation method

InventorID:

1720082 ⎘