Armin Bich

City:

Aalen

Country:

Germany

Published Applications:

Last publication date:

2014-03-20

Top Assignees for applications by Armin Bich

The entities that hold a legal rights for patent applications filed by inventor Bich Armin:

Armin Bich from Aalen, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

METHOD OF MEASURING A SHAPE OF AN OPTICAL SURFACE BASED ON COMPUTATIONALLY COMBINED SURFACE REGION MEASUREMENTS AND INTERFEROMETRIC MEASURING DEVICE

SUBSTRATE HOLDER

Method of measuring a shape of an optical surface based on computationally combined surface region measurements and interferometric measuring device

Device and method for measuring lithography masks

InventorID:

174696 ⎘