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Inventor profile of:

Murali Jayapala

City:

Vertrijk

Country:

Belgium

Published Applications:

1

Last publication date:

2017-01-05

Recent patent applications by Jayapala Murali

Murali Jayapala from Vertrijk, BE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2017-01-05

US20170005018A1

METHOD AND DEVICE FOR INSPECTION OF A SEMICONDUCTOR DEVICE

InventorID:

1764027 ⎘