Jerusalem
Israel
20
2025-07-17
The entities that hold a legal rights for patent applications filed by inventor KRIS Roman:
Roman KRIS from Jerusalem, IL has applied for patents for these inventions. The list has both pending applications and granted patents:
DETERMINATION OF UNDERCUT SIDEWALLS BASED ON AN IMAGE OF A SEMICONDUCTOR SPECIMEN
#2 | 2023-12-28EXAMINATION OF A HOLE FORMED IN A SEMICONDUCTOR SPECIMEN
#3 | 2023-03-02Local shape deviation in a semiconductor specimen
#4 | 2022-08-18Epitaxy metrology in fin field effect transistors
#5 | 2022-06-30Generating a metrology recipe usable for examination of a semiconductor specimen
#6 | 2022-06-23Determining a critical dimension variation of a pattern
#7 | 2021-12-09Method, system and computer program product for 3D-NAND CDSEM metrology
#8 | 2021-06-24Evaluating a hole formed in an intermediate product
#9 | 2021-03-04Evaluating an intermediate product related to a three-dimensional NAND memory unit
#10 | 2020-12-03Measuring height difference in patterns on semiconductor wafers
#11 | 2020-10-15Determining a critical dimension variation of a pattern
#12 | 2019-07-18Method for monitoring nanometric structures
#13 | 2018-11-22Measuring height difference in patterns on semiconductor wafers
#14 | 2018-09-20Technique for measuring overlay between layers of a multilayer structure
#15 | 2017-08-24Technique for measuring overlay between layers of a multilayer structure
#16 | 2017-07-06CD-SEM technique for wafers fabrication control
#17 | 2017-01-19Technique for measuring overlay between layers of a multilayer structure
#18 | 2014-09-18System, method and computer readable medium for detecting edges of a pattern
#19 | 2010-07-29High resolution wafer inspection system
#20 | 2008-09-25High resolution wafer inspection system
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