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Inventor profile of:

Yoichi OSE

City:

Mito

Country:

Japan

Published Applications:

Last publication date:

2013-05-23

Top Assignees for applications by Yoichi OSE

The entities that hold a legal rights for patent applications filed by inventor OSE Yoichi:

HITACHI HIGH-TECHNOLOGIES CORPORATION 20 Tokyo, Japan
HITACHI, LTD. 12 Tokyo, Japan
Hitachi High-Technologies Corporation 1 Ibaraki, Japan
Hitachi, LTD 1 , Japan
Hitachi High-Technologies Corporations 1 Tokyo, Japan
Hitachi High-Technologies Corporation 1 Minato-ku, TOKYO, Japan

Recent patent applications by OSE Yoichi

Yoichi OSE from Mito, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2013-05-23

US20130126731A1

Electricity

Charged Particle Microscope and Ion Microscope

#2 | 2013-05-16

US20130119252A1

Electricity

Gas field ion source and method for using same, ion beam device, and emitter tip and method for manufacturing same

#3 | 2013-04-11

US20130087704A1

Electricity

GAS FIELD IONIZATION ION SOURCE, SCANNING CHARGED PARTICLE MICROSCOPE, OPTICAL AXIS ADJUSTMENT METHOD AND SPECIMEN OBSERVATION METHOD

#4 | 2012-08-30

US20120217391A1

Electricity

CHARGED PARTICLE MICROSCOPE

#5 | 2012-04-26

US20120097863A1

Electricity

Ion microscope

#6 | 2010-11-25

US20100294929A1

Electricity

Sample electrification measurement method and charged particle beam apparatus

#7 | 2010-02-25

US20100044565A1

Electricity

Scanning electron microscope having a monochromator

#8 | 2009-06-18

US20090152462A1

Electricity

Gas field ionization ion source, scanning charged particle microscope, optical axis adjustment method and specimen observation method

#9 | 2009-03-12

US20090065694A1

Electricity

Scanning electron microscope

#10 | 2009-01-08

US20090008551A1

Electricity

Electron beam apparatus with aberration corrector

#11 | 2008-10-02

US20080237463A1

Electricity

Monochromator and scanning electron microscope using the same

#12 | 2008-08-21

US20080201091A1

Electricity

Sample electrification measurement method and charged particle beam apparatus

#13 | 2008-02-28

US20080048118A1

Electricity

Electron beam apparatus and method for production of its specimen chamber

#14 | 2008-02-21

US20080042074A1

Electricity

Charged particle beam apparatus and charged particle beam irradiation method

#15 | 2007-09-27

US20070221846A1

Electricity

Scanning electron microscope

#16 | 2007-08-09

US20070181805A1

Electricity

Scanning electron microscope having a monochromator

#17 | 2007-05-24

US20070114409A1

Electricity

Electron beam apparatus with aberration corrector

#18 | 2007-03-15

US20070057183A1

Electricity

Scanning electron microscope

#19 | 2006-10-19

US20060232445A1

Electricity

Electron beam apparatus and method for production of its specimen chamber

#20 | 2006-10-05

US20060219946A1

Electricity

Electron beam apparatus and method for production of its specimen chamber

#21 | 2006-10-05

US20060219918A1

Electricity

Sample electrification measurement method and charged particle beam apparatus

#22 | 2006-10-05

US20060219910A1

Electricity

Monochromator and scanning electron microscope using the same

#23 | 2006-06-01

US20060113474A1

Electricity

Scanning electron microscope

#24 | 2006-04-18

US10742901

Electron beam apparatus and method for production of its specimen chamber

#25 | 2006-04-04

US10751907

Monochromator and scanning electron microscope using the same

#26 | 2006-02-02

US20060022150A1

Electricity

Focused ion beam apparatus and focused ion beam irradiation method

#27 | 2006-01-26

US20060016991A1

Electricity

Electron beam apparatus with aberration corrector

#28 | 2006-01-03

US10754581

Electron beam apparatus with aberration corrector

#29 | 2005-12-27

US10730106

Scanning electron microscope

#30 | 2005-11-17

US20050253083A1

Electricity

Charged particle beam apparatus and charged particle beam irradiation method

#31 | 2005-10-18

US10656166

Charged particle beam apparatus and charged particle beam irradiation method

#32 | 2005-09-20

US10483596

Sample electrification measurement method and charged particle beam apparatus

#33 | 2005-07-28

US20050161600A1

Electricity

Sample electrification measurement method and charged particle beam apparatus

#34 | 2005-06-30

US20050139773A1

Electricity

Scanning electron microscope

#35 | 2005-06-23

US20050133719A1

Electricity

Scanning electron microscope

#36 | 2005-04-26

US10817834

Scanning electron microscope

#37 | 2005-03-29

US10699793

Scanning electron microscope

#38 | 2005-01-25

US10643892

Scanning electron microscope

InventorID:

182961 ⎘