Bin Li

City:

Andover, Massachusetts

Country:

United States

Published Applications:

Last publication date:

2017-04-27

Top Assignees for applications by Bin Li

The entities that hold a legal rights for patent applications filed by inventor Li Bin:

Bin Li from Andover, US has applied for patents for these inventions. The list has both pending applications and granted patents:

Magnetic Field Sensor With Integrated Self-Test Reset Wire

Method for wafer-level chip scale package testing

InventorID:

1857740 ⎘