Jaime BRAVO

City:

Berkeley, California

Country:

United States

Published Applications:

Last publication date:

2017-10-12

Top Assignees for applications by Jaime BRAVO

The entities that hold a legal rights for patent applications filed by inventor BRAVO Jaime:

Jaime BRAVO from Berkeley, US has applied for patents for these inventions. The list has both pending applications and granted patents:

Three-dimensional pattern risk scoring

Wafer level electrical test for optical proximity correction and/or etch bias

InventorID:

1859213 ⎘