Sergey Khristo

City:

Ashdod

Country:

Israel

Published Applications:

Last publication date:

2025-05-22

Top Assignees for applications by Sergey Khristo

The entities that hold a legal rights for patent applications filed by inventor Khristo Sergey:

Sergey Khristo from Ashdod, IL has applied for patents for these inventions. The list has both pending applications and granted patents:

DEFECT DETECTION USING A MACHINE LEARNING ALGORITHM

Measuring height difference in patterns on semiconductor wafers

Measuring height difference in patterns on semiconductor wafers

Technique for inspecting semiconductor wafers

System and method for printability based inspection

System and method for evaluating error sources associated with a mask

InventorID:

1910144 ⎘