Inventor profile of:

Dong CHAI

City:

Beijing

Country:

China

Published Applications:

32

Last publication date:

2025-11-13

Top Assignees for applications by Dong CHAI

The entities that hold a legal rights for patent applications filed by inventor CHAI Dong:

Recent patent applications by CHAI Dong

Dong CHAI from Beijing, CN has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-11-13
US20250349158A1
Physics

METHOD FOR PROCESSING PRODUCT MANUFACTURING MESSAGES, ELECTRONIC DEVICE, AND COMPUTER-READABLE STORAGE MEDIUM

#2 | 2025-03-13
US20250086652A1
Physics

DATA PROCESSING METHODS AND APPARATUSES, ELECTRONIC DEVICE AND STORAGFE MEDIUM

#3 | 2024-09-12
US20240304034A1
Physics

METHOD AND DEVICE FOR PROCESSING PRODUCT MANUFACTURING MESSAGES, ELECTRONIC DEVICE, AND COMPUTER-READABLE STORAGE MEDIUM

#4 | 2024-09-12
US20240303591A1
Physics

CREATION METHOD, INFORMATION PROCESSING METHOD, STORAGE METHOD, ELECTRONIC DEVICE, AND STORAGE MEDIUM

#5 | 2024-09-05
US20240296762A1
Physics

DETERMINING CORRELATION DEGREE, APPARATUS, ELECTRONIC DEVICE, AND COMPUTER-READABLE STORAGE MEDIUM

#6 | 2024-09-05
US20240296163A1
Physics

DATA PROCESSING METHODS, DEVICES AND NON-TRANSITORY STORAGE MEDIUMS

#7 | 2024-06-20
US20240202893A1
Physics

METHOD AND DEVICE FOR DETECTING DEFECT, STORAGE MEDIUM AND ELECTRONIC DEVICE

#8 | 2024-06-13
US20240193460A1
Physics

DATA PROCESSING METHOD AND DATA PROCESSING APPARATUS

#9 | 2024-04-11
US20240119584A1
Physics

Detection method, electronic device and non-transitory computer-readable storage medium

#10 | 2024-01-04
US20240004375A1
Physics

DATA PROCESSING METHOD, AND ELECTRONIC DEVICE AND STORAGE MEDIUM

#11 | 2023-12-14
US20230401692A1
Physics

METHOD FOR MEASURING ACTUAL AREA OF DEFECT, AND METHOD AND APPARATUS FOR TESTING DISPLAY PANEL

#12 | 2023-06-29
US20230206420A1
Physics

METHOD FOR DETECTING DEFECT AND METHOD FOR TRAINING MODEL

#13 | 2023-05-18
US20230153974A1
Physics

Distributed computing system for product defect analysis

#14 | 2023-05-11
US20230142383A1
Physics

Method and device for processing product manufacturing messages, electronic device, and computer-readable storage medium

#15 | 2023-03-02
US20230067182A1
Physics

Data Processing Device and Method, and Computer Readable Storage Medium

#16 | 2023-02-16
US20230048386A1
Physics

METHOD FOR DETECTING DEFECT AND METHOD FOR TRAINING MODEL

#17 | 2023-02-02
US20230030296A1
Physics

Defect detection task processing method, device, apparatus and storage medium

#18 | 2022-12-29
US20220414859A1
Physics

Image annotation method, device and system

#19 | 2022-11-24
US20220374004A1
Physics

Computer-implemented method for defect analysis, computer-implemented method of evaluating likelihood of defect occurrence, apparatus for defect analysis, computer-program product, and intelligent defect analysis system

#20 | 2022-10-27
US20220343481A1
Physics

Detection device of display panel and detection method thereof, electronic device and readable medium

#21 | 2022-10-06
US20220317644A1
Physics

System and method for producing display panels based on nonlinear program model, and non-transitory computer-readable storage medium

#22 | 2022-06-09
US20220182442A1
Electricity

Computer-implemented method for defect analysis, computer-implemented method of evaluating likelihood of defect occurrence, apparatus for defect analysis, computer-program product, and intelligent defect analysis system

#23 | 2022-05-05
US20220138899A1
Physics

Methods and apparatuses for processing image, methods and apparatuses for training image recognition network and methods and apparatuses for recognizing image

#24 | 2022-04-28
US20220129447A1
Physics

Method, system, device and medium for querying product history

#25 | 2022-04-14
US20220113710A1
Physics

System and method for recommending maximum quantity of work in process, and computer readable medium

#26 | 2022-03-24
US20220092359A1
Physics

Image data classification method, device and system

#27 | 2022-02-10
US20220043812A1
Physics

Method and device of detecting fault in production

#28 | 2021-11-25
US20210364999A1
Physics

SYSTEM AND METHOD FOR ANALYZING CAUSE OF PRODUCT DEFECT, COMPUTER READABLE MEDIUM

#29 | 2021-07-08
US20210209488A1
Physics

Inference computing apparatus, model training apparatus, inference computing system

#30 | 2021-05-06
US20210133382A1
Physics

Electronic device, method for generating package drawing and computer readable storage medium

#31 | 2019-07-04
US20190200918A1
Human necessities

Tongue-image-based diagnostic system and diagnostic method

#32 | 2017-07-06
US20170189268A1
Human necessities

APPARATUS, SYSTEM AND METHOD FOR REMOTELY DETERMINING ACUPUNCTURE POINT

InventorID:

1920403 ⎘