Inventor profile of:

Ion Matei

City:

Mountain View, California

Country:

United States

Published Applications:

16

Last publication date:

2026-05-14

Top Assignees for applications by Ion Matei

The entities that hold a legal rights for patent applications filed by inventor Matei Ion:

Recent patent applications by Matei Ion

Ion Matei from Mountain View, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-05-14
US20260134658A1
Physics

GENERATING ENHANCED VIDEO STREAM BASED ON DATA RECEIVED FROM AN UNMANNED VEHICLE

#2 | 2026-03-05
US20260067026A1
Electricity

SYSTEM AND METHOD FOR ESTIMATING ERRORS IN A SENSOR NETWORK IMPLEMENTING HIGH FREQUENCY (HF) COMMUNICATION CHANNELS

#3 | 2025-05-08
US20250148621A1
Physics

MICRO-OBJECT MOVEMENT MONITOR TO OBSERVE CONTROLLED MICRO-OBJECT MOVEMENT

#4 | 2024-06-13
US20240195524A1
Electricity

SYSTEM AND METHOD FOR ESTIMATING ERRORS IN A SENSOR NETWORK IMPLEMENTING HIGH FREQUENCY (HF) COMMUNICATION CHANNELS

#5 | 2024-05-16
US20240160802A1
Physics

REINFORCEMENT LEARNING AND NONLINEAR PROGRAMMING BASED SYSTEM DESIGN

#6 | 2024-04-18
US20240129059A1
Electricity

SYSTEM AND METHOD FOR SYMBOL DECODING IN HIGH FREQUENCY (HF) COMMUNICATION CHANNELS

#7 | 2024-03-14
US20240086604A1
Physics

SYSTEM AND METHOD FOR MICRO-OBJECT DENSITY DISTRIBUTION CONTROL WITH THE AID OF A DIGITAL COMPUTER

#8 | 2024-03-07
US20240078459A1
Physics

QUANTUM COMPUTING FOR GENERATING ALL DIAGNOSES OF A DIGITAL CIRCUIT

#9 | 2024-02-29
US20240070041A1
Physics

METHOD AND SYSTEM FOR GENERATING TEST INPUTS FOR FAULT DIAGNOSIS

#10 | 2024-01-04
US20240003970A1
Physics

Hybrid solver for integrated circuit diagnostics and testing

#11 | 2023-12-14
US20230401360A1
Physics

SYSTEM DESIGN BASED ON PROCESS FLOW DIAGRAM INFORMATION EXTRACTION AND GENERATIVE MODELS

#12 | 2023-12-14
US20230400846A1
Physics

HYBRID REASONING BASED ON PHYSICS AND MACHINE LEARNING FOR PROGNOSTICS OF SYSTEMS WITH CONFLATED DEGRADATION MODES

#13 | 2023-08-17
US20230259113A1
Physics

SUBSYSTEM-LEVEL MODEL-BASED DIAGNOSIS

#14 | 2023-06-15
US20230185998A1
Physics

SYSTEM AND METHOD FOR AI-ASSISTED SYSTEM DESIGN

#15 | 2022-11-17
US20220365136A1
Physics

Method and system for efficient testing of digital integrated circuits

#16 | 2017-07-06
US20170193143A1
Physics

Method for Modelica-based system fault analysis at the design stage

InventorID:

1924128 ⎘