Inventor profile of:

Martin Gerhardt

City:

Dresden

Country:

Germany

Published Applications:

25

Last publication date:

2019-04-11

Top Assignees for applications by Martin Gerhardt

The entities that hold a legal rights for patent applications filed by inventor Gerhardt Martin:

Recent patent applications by Gerhardt Martin

Martin Gerhardt from Dresden, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2019-04-11
US20190109192A1
Electricity

Transistor element with reduced lateral electrical field

#2 | 2018-12-13
US20180358259A1
Electricity

Heat dissipative element for polysilicon resistor bank

#3 | 2018-06-07
US20180158833A1
Electricity

Semiconductor structure including a plurality of pairs of nonvolatile memory cells and an edge cell

#4 | 2017-11-16
US20170330889A1
Electricity

Semiconductor structure including a plurality of pairs of nonvolatile memory cells and an edge cell and method for the formation thereof

#5 | 2016-04-07
US20160099336A1
Electricity

OPC enlarged dummy electrode to eliminate ski slope at eSiGe

#6 | 2015-11-26
US20150340362A1
Electricity

Transistor devices with high-k insulation layers

#7 | 2014-09-18
US20140273370A1
Electricity

Technique for manufacturing semiconductor devices comprising transistors with different threshold voltages

#8 | 2014-03-13
US20140070321A1
Electricity

INTEGRATED CIRCUITS HAVING BORON-DOPED SILICON GERMANIUM CHANNELS AND METHODS FOR FABRICATING THE SAME

#9 | 2014-01-30
US20140027859A1
Electricity

Methods of forming transistor devices with high-k insulation layers and the resulting devices

#10 | 2013-04-18
US20130095627A1
Electricity

Methods of Forming Source/Drain Regions on Transistor Devices

#11 | 2012-09-27
US20120241864A1
Electricity

Shallow source and drain architecture in an active region of a semiconductor device having a pronounced surface topography by tilted implantation

#12 | 2011-09-15
US20110223733A1
Electricity

Method for forming a strained transistor by stress memorization based on a stressed implantation mask

#13 | 2011-09-08
US20110215415A1
Electricity

Technique for enhancing transistor performance by transistor specific contact design

#14 | 2011-06-30
US20110159654A1
Electricity

Enhanced confinement of high-K metal gate electrode structures by reducing material erosion of a dielectric cap layer upon forming a strain-inducing semiconductor alloy

#15 | 2010-02-25
US20100047985A1
Electricity

METHOD FOR FABRICATING A SEMICONDUCTOR DEVICE WITH SELF-ALIGNED STRESSOR AND EXTENSION REGIONS

#16 | 2008-12-09
US11205797
-

Methods for fabricating a stressed MOS device

#17 | 2008-12-04
US20080296692A1
Electricity

Technique for strain engineering in silicon-based transistors by using implantation techniques for forming a strain-inducing layer under the channel region

#18 | 2008-10-30
US20080265330A1
Electricity

Technique for enhancing transistor performance by transistor specific contact design

#19 | 2008-07-31
US20080179661A1
Electricity

Enhanced stress transfer in an interlayer dielectric by using an additional stress layer above a dual stress liner in a semiconductor device

#20 | 2008-03-25
US11207265
-

Methods for fabricating a CMOS device including silicide contacts

#21 | 2008-01-31
US20080026572A1
Electricity

Method for forming a strained transistor by stress memorization based on a stressed implantation mask

#22 | 2008-01-31
US20080026552A1
Electricity

Method of enhancing lithography capabilities during gate formation in semiconductors having a pronounced surface topography

#23 | 2007-12-06
US20070278596A1
Electricity

Method of increasing transistor drive current by recessing an isolation trench

#24 | 2007-10-04
US20070232033A1
Electricity

METHOD FOR FORMING ULTRA-SHALLOW HIGH QUALITY JUNCTIONS BY A COMBINATION OF SOLID PHASE EPITAXY AND LASER ANNEALING

#25 | 2006-01-05
US20060003510A1
Electricity

Technique for transferring strain into a semiconductor region

InventorID:

197953 ⎘