Weiqiang Sun

City:

Beijing

Country:

China

Published Applications:

Last publication date:

2023-01-05

Top Assignees for applications by Weiqiang Sun

The entities that hold a legal rights for patent applications filed by inventor Sun Weiqiang:

ZHONGKE JINGYUAN ELECTRON LIMITED, Beijing (CN) 5 Beijing, China
Dongfang Jingyuan Electron Limited 2 Beijing, China
Zhongke Jingyuan Electron Limited 2 Beijing, China

Recent patent applications by Sun Weiqiang

Weiqiang Sun from Beijing, CN has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2023-01-05

US20230005709A1

Electricity

Scanning electron microscope device and electron beam inspection apparatus

#2 | 2023-01-05

US20230005704A1

Electricity

Scanning electron microscope device and electron beam inspection apparatus

#3 | 2022-05-19

US20220157556A1

Electricity

Wien filter and charged particle beam imaging apparatus

#4 | 2021-03-04

US20210066022A1

Electricity

Wien filter and charged particle beam imaging apparatus

#5 | 2021-03-04

US20210066021A1

Electricity

Multi-pole deflector for charged particle beam and charged particle beam imaging apparatus

#6 | 2019-03-21

US20190088442A1

Electricity

Electron-Beam Inspection Systems with optimized throughput

#7 | 2018-09-06

US20180254167A1

Electricity

Patterned substrate imaging using multiple electron beams

#8 | 2017-10-19

US20170301509A1

Electricity

Multi-Stage/Multi-Chamber Electron-Beam Inspection System

#9 | 2017-10-19

US20170301508A1

Electricity

Multi-stage/multi-chamber electron-beam inspection system

InventorID:

2016373 ⎘