Yonas T. Yemane

City:

Mountain View, California

Country:

United States

Published Applications:

Last publication date:

2013-04-18

Recent patent applications by Yemane Yonas T.

Yonas T. Yemane from Mountain View, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2013-04-18

US20130097740A1

Physics

Scanning probe microscopy-based metrology tool with a vacuum partition

InventorID:

202189 ⎘