Markus Bartscher

City:

Edemissen

Country:

Germany

Published Applications:

Last publication date:

2020-01-02

Top Assignees for applications by Markus Bartscher

The entities that hold a legal rights for patent applications filed by inventor Bartscher Markus:

Markus Bartscher from Edemissen, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

Method for dimensional x-ray measurement, in particular by computed tomography, and x-ray computed tomography scanner

Method for monitoring the functional state of a system for computer-tomographic examination of workpieces

Determination of localised quality measurements from a volumetric image record

InventorID:

2040703 ⎘