Poughkeepsie, New York
United States
19
2021-03-11
The entities that hold a legal rights for patent applications filed by inventor Patel Pradip:
Pradip Patel from Poughkeepsie, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Built-in self-test for bit-write enabled memory arrays
#2 | 2021-03-11Sequential error capture during memory test
#3 | 2021-01-12Power saving scannable latch output driver
#4 | 2018-06-21Testing content addressable memory and random access memory
#5 | 2018-05-31Testing content addressable memory and random access memory
#6 | 2018-04-26Testing content addressable memory and random access memory
#7 | 2017-12-07Partition-able storage of test results using inactive storage elements
#8 | 2017-07-04Multi-match error detection in content addressable memory testing
#9 | 2017-04-18Shift register with opposite shift data and shift clock directions
#10 | 2011-12-15Memory testing system
#11 | 2011-12-01TESTING MEMORY ARRAYS AND LOGIC WITH ABIST CIRCUITRY
#12 | 2009-08-13Self test apparatus for identifying partially defective memory
#13 | 2008-03-06Merged MISR and output register without performance impact for circuits under test
#14 | 2006-09-14Method for self-correcting cache using line delete, data logging, and fuse repair correction
#15 | 2006-08-31Clock duty cycle based access timer combined with standard stage clocked output register
#16 | 2006-08-31Merged MISR and output register without performance impact for circuits under test
#17 | 2006-08-03Array self repair using built-in self test techniques
#18 | 2006-07-13Self test method and apparatus for identifying partially defective memory
#19 | 2005-12-01BIST address generation architecture for multi-port memories
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