Inventor profile of:

Daniel Rodko

City:

Poughkeepsie, New York

Country:

United States

Published Applications:

18

Last publication date:

2026-05-14

Top Assignees for applications by Daniel Rodko

The entities that hold a legal rights for patent applications filed by inventor Rodko Daniel:

Recent patent applications by Rodko Daniel

Daniel Rodko from Poughkeepsie, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-05-14
US20260133882A1
Physics

DIAGNOSABILITY FOR SHARED OUTPUT REGISTERS

#2 | 2026-01-29
US20260031175A1
Physics

DIAGNOSTIC BUILT-IN SELF-TEST CIRCUIT ENHANCEMENTS FOR MEMORY ARRAYS

#3 | 2025-09-04
US20250279148A1
Physics

RECONFIGURABLE TESTING OF AN INTEGRATED CIRCUIT

#4 | 2023-03-23
US20230089274A1
Physics

Testing bit write operation to a memory array in integrated circuits

#5 | 2021-10-14
US20210319845A1
Physics

Microchip level shared array repair

#6 | 2021-03-11
US20210074376A1
Physics

Built-in self-test for bit-write enabled memory arrays

#7 | 2021-03-11
US20210074375A1
Physics

Sequential error capture during memory test

#8 | 2021-01-12
US16559776
Physics

Power saving scannable latch output driver

#9 | 2018-12-20
US20180364309A1
Physics

On-chip hardware-controlled window strobing

#10 | 2018-12-20
US20180364308A1
Physics

On-chip hardware-controlled window strobing

#11 | 2018-06-21
US20180174666A1
Physics

Testing content addressable memory and random access memory

#12 | 2018-05-31
US20180151248A1
Physics

Testing content addressable memory and random access memory

#13 | 2018-04-26
US20180114585A1
Physics

Testing content addressable memory and random access memory

#14 | 2017-12-07
US20170350940A1
Physics

Partition-able storage of test results using inactive storage elements

#15 | 2017-07-04
US15084639
Physics

Multi-match error detection in content addressable memory testing

#16 | 2017-04-18
US15197271
Physics

Shift register with opposite shift data and shift clock directions

#17 | 2011-12-15
US20110307747A1
Physics

Memory testing system

#18 | 2011-12-01
US20110296259A1
Physics

TESTING MEMORY ARRAYS AND LOGIC WITH ABIST CIRCUITRY

InventorID:

2058373 ⎘