Inventor profile of:

Daniel KRAEHMER

City:

Essingen

Country:

Germany

Published Applications:

39

Last publication date:

2019-03-07

Top Assignees for applications by Daniel KRAEHMER

The entities that hold a legal rights for patent applications filed by inventor KRAEHMER Daniel:

Recent patent applications by KRAEHMER Daniel

Daniel KRAEHMER from Essingen, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2019-03-07
US20190072861A1
Physics

LITHOGRAPHY PROJECTION OBJECTIVE, AND A METHOD FOR CORRECTING IMAGE DEFECTS OF THE SAME

#2 | 2018-06-14
US20180164474A1
Physics

PROJECTION OBJECTIVE FOR MICROLITHOGRAPHY

#3 | 2017-11-09
US20170322343A1
Physics

MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS

#4 | 2017-07-06
US20170192362A1
Physics

Microlithography projection objective

#5 | 2016-12-22
US20160370709A1
Physics

Lithography projection objective, and a method for correcting image defects of the same

#6 | 2016-01-07
US20160004164A1
Physics

Illumination system for an EUV lithography device and facet mirror therefor

#7 | 2015-06-18
US20150173163A1
Electricity

EUV light source for generating a usable output beam for a projection exposure apparatus

#8 | 2014-11-13
US20140333913A1
Physics

Microlithography projection objective

#9 | 2014-11-06
US20140327891A1
Physics

Lithography projection objective, and a method for correcting image defects of the same

#10 | 2014-10-30
US20140320955A1
Physics

MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS

#11 | 2014-10-02
US20140293256A1
Physics

MICROLITHOGRAPHY PROJECTION OBJECTIVE

#12 | 2014-09-18
US20140268085A1
Physics

Optical system for a microlithographic projection exposure apparatus

#13 | 2014-07-10
US20140192339A1
Physics

Collector

#14 | 2013-04-25
US20130100428A1
Physics

Mask for EUV lithography, EUV lithography system and method for optimising the imaging of a mask

#15 | 2012-09-20
US20120236272A1
Physics

Combination stop for catoptric projection arrangement

#16 | 2012-01-26
US20120019800A1
Physics

Lithography projection objective, and a method for correcting image defects of the same

#17 | 2011-09-29
US20110235013A1
Physics

Projection objective of a microlithographic projection exposure apparatus

#18 | 2011-09-15
US20110222043A1
Physics

Microlithographic projection exposure apparatus

#19 | 2011-03-24
US20110069295A1
Physics

Optical system for microlithography

#20 | 2010-08-19
US20100208225A1
Physics

PROJECTION OBJECTIVE FOR MICRLOLITHOGRAPHY HAVING AN OBSCURATED PUPIL

#21 | 2010-06-24
US20100157435A1
Physics

Lithography projection objective, and a method for correcting image defects of the same

#22 | 2010-06-17
US20100149510A1
Physics

METHODS FOR PRODUCING AN ANTIREFLECTION SURFACE ON AN OPTICAL ELEMENT, OPTICAL ELEMENT AND ASSOCIATED OPTICAL ARRANGEMENT

#23 | 2010-04-22
US20100097592A1
Physics

High transmission, high aperture catadioptric projection objective and projection exposure apparatus

#24 | 2010-04-01
US20100079741A1
Physics

PROJECTION OBJECTIVE FOR MICROLITHOGRAPHY

#25 | 2010-04-01
US20100079739A1
Physics

Projection objective for microlithography with stray light compensation and related methods

#26 | 2009-12-10
US20090306921A1
Physics

Optimization and matching of optical systems by use of orientation Zernike polynomials

#27 | 2009-11-19
US20090284831A1
Physics

Projection objective of a microlithographic projection exposure apparatus

#28 | 2009-08-06
US20090195876A1
Physics

METHOD FOR DESCRIBING A RETARDATION DISTRIBUTION IN A MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS

#29 | 2009-05-07
US20090115986A1
Physics

Microlithography projection objective

#30 | 2009-04-23
US20090103184A1
Physics

Lithography projection objective, and a method for correcting image defects of the same

#31 | 2009-03-26
US20090080086A1
Physics

Symmetrical objective having four lens groups for microlithography

#32 | 2009-01-22
US20090021830A1
Physics

PROJECTION LENS OF A MICROLITHOGRAPHIC EXPOSURE SYSTEM

#33 | 2009-01-22
US20090021714A1
Physics

Combination stop for catoptric projection arrangement

#34 | 2008-12-04
US20080297754A1
Physics

Microlithographic projection exposure apparatus

#35 | 2008-11-13
US20080278799A1
Physics

Projection objective of a microlithographic projection exposure apparatus

#36 | 2008-09-04
US20080212060A1
Physics

Method for determining intensity distribution in the image plane of a projection exposure arrangement

#37 | 2008-08-28
US20080204877A1
Physics

Illumination system or projection lens of a microlithographic exposure system

#38 | 2008-06-19
US20080144184A1
Physics

Lithography projection objective, and a method for correcting image defects of the same

#39 | 2008-04-17
US20080088816A1
Physics

Microlithograph system

InventorID:

207059 ⎘