Campbell, California
United States
26
2026-03-26
The entities that hold a legal rights for patent applications filed by inventor TERREL Matthew A.:
Matthew A. TERREL from Campbell, US has applied for patents for these inventions. The list has both pending applications and granted patents:
OPTICAL MEASUREMENT SYSTEMS WITH SELECTIVE POLARIZATION
#2 | 2025-09-18RESOLVE PATH OPTICAL SAMPLING ARCHITECTURES
#3 | 2025-07-17OPTICAL MEASUREMENT SYSTEMS WITH MULTI-WAVELENGTH EMISSION
#4 | 2025-04-03PHOTONIC SWITCH WITH MULTI-WAVELENGTH ROUTING CAPABILITIES
#5 | 2025-04-03OPTICAL MEASUREMENT SYSTEMS AND METHODS
#6 | 2025-04-03OPTICAL MEASUREMENT SYSTEMS WITH MULTI-WAVELENGTH EMISSION
#7 | 2025-02-27OPTICAL SYSTEM FOR NOISE MITIGATION
#8 | 2024-08-29OPTICAL SYSTEM FOR REFERENCE SWITCHING
#9 | 2024-04-11Optical system for noise mitigation
#10 | 2024-03-28Despeckling in optical measurement systems
#11 | 2024-03-21MACH-ZEHNDER INTERFEROMETER DEVICE FOR WAVELENGTH LOCKING
#12 | 2023-12-05Mach-Zehnder interferometer device for wavelength locking
#13 | 2023-10-12Optical Measurement System with Multiple Launch Sites
#14 | 2023-10-05Optical Inspection System and Method Including Accounting for Variations of Optical Path Length Within a Sample
#15 | 2023-08-24Resolve Path Optical Sampling Architectures
#16 | 2022-05-05Optical system for reference switching
#17 | 2022-03-10Optical system for noise mitigation
#18 | 2021-09-30Optical inspection system and method including accounting for variations of optical path length within a sample
#19 | 2021-07-01Resolve path optical sampling architectures
#20 | 2021-01-14Optical system for reference switching
#21 | 2019-07-04Optical inspection system and method including accounting for variations of optical path length within a sample
#22 | 2019-05-02Optical system for reference switching
#23 | 2018-08-16Measurement time distribution in referencing schemes
#24 | 2018-02-08Confocal inspection system having averaged illumination and averaged collection paths
#25 | 2018-01-18Confocal inspection system having non-overlapping annular illumination and collection regions
#26 | 2018-01-18Optical inspection system and method including accounting for variations of optical path length within a sample
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